Oversized via as through-substrate-via (tsv) stop layer

ABSTRACT

The present disclosure, in some embodiments, relates to an integrated chip structure. The integrated chip structure includes a standard contact disposed within a dielectric structure on a substrate. An oversized contact is disposed within the dielectric structure and is laterally separated from the standard contact. The oversized contact has a larger width than the standard contact. An interconnect wire vertically contacts the oversized contact. A through-substrate via (TSV) vertically extends through the substrate. The TSV physically and vertically contacts the oversized contact or the interconnect wire. The TSV vertically overlaps the oversized contact or the interconnect wire over a non-zero distance.

REFERENCE TO RELATED APPLICATION

This application is a Continuation of U.S. application Ser. No. 16/898,647, filed on Jun. 11, 2020, the contents of which are hereby incorporated by reference in their entirety.

BACKGROUND

Integrated chip fabrication is a complex multiple-step process during which electronic circuits are formed on a wafer made out of a semiconducting material (e.g., silicon). Integrated chip fabrication can be broadly divided into front-end-of-line (FEOL) processing and back-end-of-line (BEOL) processing. FEOL processing generally relates to the formation of devices (e.g., transistors) within the semiconductor material, while BEOL processing generally relates to the formation of conductive interconnect layers within a dielectric structure over the semiconductor material. After BEOL processing is completed, bond pads are formed and then the wafer may be singulated (e.g., diced) to form a plurality of separate integrated chip die.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the following detailed description when read with the accompanying figures. It is noted that, in accordance with the standard practice in the industry, various features are not drawn to scale. In fact, the dimensions of the various features may be arbitrarily increased or reduced for clarity of discussion.

FIG. 1 illustrates a cross-sectional view of some embodiments of an integrated chip structure having an oversized via configured to act as a stop layer for a through-substrate via (TSV).

FIG. 2 illustrates a cross-sectional view of some embodiments of a multi-dimensional integrated chip structure having an oversized via.

FIGS. 3-10 illustrate some additional embodiments of an integrated chip structure having an oversized via.

FIGS. 11-21 illustrate cross-sectional views of some embodiments of a method of forming an integrated chip structure having an oversized via.

FIG. 22 illustrates a flow diagram of some embodiments of a method of forming an integrated chip structure having an oversized via.

FIGS. 23-33 illustrate cross-sectional views of some alternative embodiments of a method of forming an integrated chip structure having an oversized via.

FIG. 34 illustrates a flow diagram of some alternative embodiments of a method of forming an integrated chip structure having an oversized via.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, or examples, for implementing different features of the provided subject matter. Specific examples of components and arrangements are described below to simplify the present disclosure. These are, of course, merely examples and are not intended to be limiting. For example, the formation of a first feature over or on a second feature in the description that follows may include embodiments in which the first and second features are formed in direct contact, and may also include embodiments in which additional features may be formed between the first and second features, such that the first and second features may not be in direct contact. In addition, the present disclosure may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,” “above,” “upper” and the like, may be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the figures. The spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. The apparatus may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein may likewise be interpreted accordingly.

Three-dimensional integrated chips (3DIC) comprise a plurality of integrated chip (IC) tiers stacked onto one another. The plurality of IC tiers respectively comprise a semiconductor substrate. One or more of the plurality of IC tiers may also comprise a plurality of interconnect layers disposed within a dielectric structure on a front-side of a semiconductor substrate. The plurality of interconnect layers comprise conductive interconnect wires and vias, which increase in size from a thin interconnect layer (e.g., a “metal 1” layer) to a thicker interconnect layer (e.g., a “top metal” layer) as a distance from the semiconductor substrate increases. In some 3DIC, the plurality of interconnect layers may be coupled to a bond pad structure located along a back-side of the semiconductor substrate. In such 3DIC, a through-substrate via (TSV) extends through the semiconductor substrate to connect the plurality of interconnect layers to the bond pad structure.

A TSV may be formed by etching the back-side of the semiconductor substrate to form a TSV opening that extends through the semiconductor substrate to one of the plurality of interconnect layers. A conductive material is subsequently formed within the TSV opening. To minimize disruption of routing of the plurality of interconnect layers, the TSV opening may be formed to extend to a thin interconnect layer (e.g., a “metal 1” layer). However, it has been appreciated that an etching process used to form the TSV opening may damage the thin interconnect layer. For example, when an etchant used to form the TSV opening reaches the thin interconnect layer, the etchant may vertically over-etch through the thin interconnect layer. Over-etching through the thin interconnect layer can lead to reliability problems (e.g., time dependent dielectric breakdown (TDDB), leakage, and/or chip failure).

The present disclosure, in some embodiments, relates to an integrated chip structure comprising an oversized via that is configured to act as a stop layer for a through-substrate via (TSV). The integrated chip structure may comprise a plurality of interconnects disposed within a dielectric structure on a substrate. The plurality of interconnects comprise a first interconnect wire layer and a first via layer. The first interconnect wire layer comprises a first interconnect wire and a second interconnect wire. The first via layer comprises a standard via physically contacting the first interconnect wire and an oversized via physically contacting the second interconnect wire. The oversized via is larger (e.g., wider) than the standard via. A TSV extends through the substrate to physically contact the second interconnect wire and/or the oversized via.

The oversized via laterally extends past opposing sides of the TSV, so that the second interconnect wire and oversized via are able to form a thick interconnect structure that can effectively act as a stop layer for an etching process used to form the TSV. By using the oversized via to act as part of a stop layer for an etching process used to form the TSV, negative effects (e.g., time dependent dielectric breakdown, leakage, and/or chip failure) of over-etching through the second interconnect wire can be mitigated.

FIG. 1 illustrates a cross-sectional view of some embodiments of an integrated chip structure 100 having an oversized via configured to act as a stop layer for a through-substrate via (TSV).

The integrated chip structure 100 comprises a plurality of interconnect layers 106 disposed within a dielectric structure 104 on a first side 103 a (e.g., a front-side) of a substrate 102. The plurality of interconnect layers 106 comprise a plurality of interconnect wire layers 108 a-108 b vertically separated from one another by a plurality of via layers 110 a-110 b. The plurality of interconnect wire layers 108 a-108 b are configured to provide for lateral routing, while the plurality of via layers 110 a-110 b are configured to provide for vertical routing between adjacent ones of the plurality of interconnect wire layers 108 a-108 b. The plurality of interconnect wire layers 108 a-108 b and the plurality of via layers 110 a-110 b may have sizes (e.g., heights and/or widths) that increase as a distance from the substrate 102 increases. For example, in some embodiments, the plurality of interconnect wire layers 108 a-108 b may comprise a first interconnect wire layer 108 a and a second interconnect wire layer 108 b separated from the substrate 102 by the first interconnect wire layer 108 a. The first interconnect wire layer 108 a has interconnect wires with a first size (e.g., a first height and/or width) and the second interconnect layer 108 b has interconnect wires with a second size (e.g., a second height and/or width) that is larger than the first size.

In some embodiments, the first interconnect wire layer 108 a may comprise a first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂. The first interconnect wire 109 w ₁ is laterally separated from the second interconnect wire 109 w ₂ by way of the dielectric structure 104. In some embodiments, the plurality of via layers 110 a-110 b may comprise a first via layer 110 a having a standard via 111 v _(s) and an oversized via 111 v _(o). The oversized via 111 v _(o) has a larger size (e.g., width) than the standard via 111 v _(s). In some embodiments, the standard via 111 v _(s) physically contacts the first interconnect wire 109 w ₁ and the oversized via 111 v _(o) physically contacts the second interconnect wire 109 w ₂. In some embodiments, the oversized via 111 v _(o) may also have a larger size (e.g., width) than a via on a second via layer 110 b.

A through-substrate via (TSV) 112 extends through the substrate 102 to contact the second interconnect wire 109 w ₂ and/or the oversized via 111 v _(o). In some embodiments, the TSV 112 may further contact a bond pad structure 114 that is disposed along a second side 103 b of the substrate 102 and that is surrounded by a passivation structure 116. A conductive bonding structure 118 (e.g., a conductive bump, a conductive post, and/or the like) is disposed on the bond pad structure 114.

The TSV 112 has a minimum width that is smaller than a width of the oversized via 111 v _(o). In some embodiments, the oversized via 111 v _(o) laterally extends past opposing sides of the TSV 112. Because the oversized via 111 v _(o) is wider than the TSV 112, the second interconnect wire 109 w ₂ and the oversized via 111 v _(o) are able to collectively define a thick interconnect structure that can effectively act as a stop layer for an etch used to form the TSV 112. Having the second interconnect wire 109 w ₂ and the oversized via 111 v _(o) collectively act as a stop layer mitigates negative effects of over-etching through a thin interconnect layer.

Furthermore, the oversized via 111 v _(o) is also able to provide the integrated chip structure 100 with good electrical performance. For example, in some embodiments, the TSV 112 may be configured to carry relatively large currents (e.g., greater than 10 mA, greater than 50 mA, or the like), which may result in a large current density within standard vias on thin interconnect layers. The large current density can lead to high resistances and/or increased electro-migration between interconnect wires and vias, leading to performance and/or reliability problems. To prevent large current densities within a standard via, large arrays of standard vias can be placed between thin interconnect wires coupled to the TSV 112 to distribute a large current. However, such via arrays consume a large footprint that can negatively impact interconnect routing. The oversized via 111 v _(o) is able to carry a large current at a relatively low current density (e.g., a current density that is lower than the standard via) while consuming a relatively small footprint (e.g., a footprint smaller than a via array that would provide for a same current density), thereby providing for a good electrical performance (e.g., relatively low resistance and/or electro-migration) without substantially compromising routing of the plurality of interconnect layers 106.

FIG. 2 illustrates a cross-sectional view of some embodiments of a multi-dimensional integrated chip structure 200 having an oversized via.

The multi-dimensional integrated chip structure 200 comprises a plurality of integrated chip (IC) tiers 202 a-202 b stacked onto one another. In some embodiments, the plurality of IC tiers 202 a-202 b may respectively comprise an IC die (singulated from wafers), a wafer comprising a plurality of IC die, or the like. In some embodiments, the plurality of IC tiers 202 a-202 b may comprise a first IC tier 202 a and a second IC tier 202 b. In some embodiments, the first IC tier 202 a may comprise a first plurality of interconnect layers 106 a disposed within a first dielectric structure 104 a on a first substrate 102 a. In some embodiments, the second IC tier 202 b may comprise a second plurality of interconnect layers 106 b disposed within a second dielectric structure 104 b on a second substrate 102 b. In various embodiments, the first substrate 102 a and the second substrate 102 b may be any type of semiconductor body (e.g., silicon, SiGe, SOI, etc.), as well as any other type of semiconductor, epitaxial, dielectric, or metal layers, associated therewith. In some embodiments, the first plurality of interconnect layers 106 a and the second plurality of interconnect layers 106 b may comprise a metal such as copper, aluminum, tungsten, or the like.

The first IC tier 202 a is coupled to the second IC tier 202 b by way of a bonding structure 204. In some embodiments, the bonding structure 204 may comprise a hybrid bonding structure having a bonding interface 203 comprising metal bonding regions 206 and dielectric bonding regions 208. In some embodiments, one or more of the metal bonding regions 206 may be coupled to interconnects, within the first dielectric structure 104 a and the second dielectric structure 104 b, which are coupled to devices within the first substrate 102 a and/or the second substrate 102 b. In some additional embodiments, one or more of the metal bonding regions 206 may be coupled between a first dummy interconnect 106 d 1 within the first dielectric structure 104 a and a second dummy interconnect 106 d 2 within the second dielectric structure 104 b. The first dummy interconnect 106 d 1 and the second dummy interconnect 106 d 2 are not electrically coupled to devices (e.g., transistor devices) within the integrated chip structure 200. In other embodiments (not shown), the bonding structure 204 may comprise a dielectric bonding structure having one or more dielectric materials extending along an entirety of the bonding interface 203.

The second plurality of interconnect layers 106 b comprise a first interconnect wire layer 108 a and a first via layer 110 a. The first interconnect wire layer 108 a is vertically between the second substrate 102 b and the first via layer 110 a. The first interconnect wire layer 108 a has a first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂. The first via layer 110 a has a standard via 111 v _(s) physically contacting the first interconnect wire 109 w ₁ and an oversized via 111 v _(o) physically contacting the second interconnect wire 109 w ₂. The oversized via 111 v _(o) has a larger width than the standard via 111 v _(s). In some embodiments the standard via 111 v _(s) and the oversized via 111 v _(o) may be a same material (e.g., copper, aluminum, tungsten, or the like).

A TSV 112 extends through the second substrate 102 b to contact the second interconnect wire 109 w ₂. In some embodiments, the TSV 112 may extend into the second interconnect wire 109 w ₂ so that sidewalls of the second interconnect wire 109 w ₂ laterally surround a part of the TSV 112. In some additional embodiments, the TSV 112 may extend through the second interconnect wire 109 w ₂ to further contact the oversized via 111 v _(o). In some embodiments, the TSV 112 further contacts a bond pad structure 114 disposed along a back-side of the second substrate 102 b and surrounded by a passivation structure 116. In some embodiments, the bond pad structure 114 comprises one or more redistribution layers (RDL). For example, in some embodiments the bond pad structure 114 may comprise an RDL via 210 and an RDL wire 212.

In some embodiments, the passivation structure 116 may comprise one or more lower passivation layers 214-216 below the bond pad structure 114 and one or more upper passivation layers 218-220 over the bond pad structure 114. In some embodiments, the one or more lower passivation layers 214-216 may comprise a first lower passivation layer 214 disposed on the second substrate 102 b and a second lower passivation layer 216 disposed on the first lower passivation layer 214. In some embodiments, the one or more upper passivation layers 218-220 may comprise a first upper passivation layer 218 disposed on the second lower passivation layer 216 and a second upper passivation layer 220 disposed on the first upper passivation layer 218. In some embodiments, the first lower passivation layer 214 and the second upper passivation layer 220 may comprise a nitride (e.g., silicon nitride), a carbide (e.g., silicon carbide), or the like. In some embodiments, the second lower passivation layer 216 and the first upper passivation layer 218 may comprise silicate glass (USG), borophosphosilicate glass (BPSG), or the like.

The one or more upper passivation layers 218-220 have sidewalls that define an opening directly over the bond pad structure 114. A conductive bonding structure 118 is disposed within the opening and on the bond pad structure 114. In some embodiments, the conductive bonding structure 118 may comprise an under bump metallurgy (UBM) 118 a disposed onto the bond pad structure 114 and a conductive bump 118 b (e.g., a solder bump) disposed onto the UBM 118 a. The UBM 118 a includes a diffusion barrier layer and a seed layer. The diffusion barrier layer may also function as an adhesion layer (or a glue layer), in some embodiments. The diffusion barrier layer may comprise tantalum, tantalum nitride, titanium, titanium nitride, or combination thereof. The seed layer comprises a material that is configured to enable deposition of metal posts, solder bumps, or the like. In other embodiments (not shown), the conductive bonding structure 118 may comprise a UBM 118 a disposed onto the bond pad structure 114 and a conductive post (e.g., a copper post, a copper micro-post, or the like) disposed on the UBM 118 a.

FIG. 3 illustrates a cross-sectional view of some alternative embodiments of an integrated chip 300 having an oversized via configured to act as a stop layer for a TSV.

The integrated chip 300 comprises a first IC tier 202 a and a second IC tier 202 b. The first IC tier 202 a is coupled to the second IC tier 202 b by way of a bonding structure 204. The second IC tier 202 b comprises a second plurality of interconnect layers 106 b disposed on a second substrate 102 b. The second plurality of interconnect layers 106 b includes a first interconnect wire layer 108 a and a first via layer 110 a. The first via layer 110 a is vertically between a second substrate 102 b and the first interconnect wire layer 108 a. The first interconnect wire layer 108 a has a first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂. The first via layer 110 a has a standard via 111 v _(s) contacting the first interconnect wire 109 w ₁ and an oversized via 111 v _(o) contacting the second interconnect wire 109 w ₂.

In some embodiments, the standard via 111 v _(s) and the oversized via 111 v _(o) may contact the second substrate 102 b. In some such embodiments, the standard via 111 v _(s) and the oversized via 111 v _(o) may comprise a different material than the first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂. For example, the standard via 111 v _(s) and the oversized via 111 v _(o) may comprise tungsten, while the first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂ may comprise copper. In other embodiments (not shown), the standard via 111 v _(s) and the oversized via 111 v _(o) may be separated from the second substrate 102 b by one or more layers (e.g., one or more middle-end-of-the-line (MEOL) layers). In some such embodiments, the standard via 111 v _(s) and the oversized via 111 v _(o) may comprise a same material (e.g., copper) as the first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂.

A TSV 112 extends through the second substrate 102 b to contact the oversized via 111 v _(o). In some embodiments, the TSV 112 may extend into the oversized via 111 v _(o) so that sidewalls of the oversized via 111 v _(o) laterally surround a part of the TSV 112. In some additional embodiments, the TSV 112 may extend through the oversized via 111 v _(o) to further contact the second interconnect wire 109 w ₂.

In some embodiments, a via array 302 comprising a plurality of vias may contact a side of the second interconnect wire opposing the oversized via 111 v _(o). The via array 302 is able to carry a relatively large current without causing a high current density within individual vias of the via array 302 that may be detrimental to reliability or cause a high resistance. In some embodiments, the via array 302 may have a width that is greater than or equal to the oversized via 111 v _(o). In some embodiments, the oversized via 111 v _(o) may reduce a resistance measured between the TSV 112 and the second interconnect wire 109 w ₂ by up to approximately 25% compared TSV landing directly onto the second interconnect wire 109 w ₂. In other embodiments (not shown), a second oversized via may contact the side of the second interconnect wire 109 w ₂ opposing the oversized via 111 v _(o).

FIGS. 4A-4B illustrate some additional embodiments of an integrated chip structure having an oversized via configured to act as a stop layer for a TSV.

As shown in cross-sectional view 400 of FIG. 4A, the integrated chip structure comprises a dielectric structure 104 arranged on a first side (e.g., a front-side) of a substrate 102. In some embodiments, a transistor device 402 is disposed within the substrate 102. The transistor device 402 comprises a gate structure 404 disposed between a source region 406 a and a drain region 406 b. In some embodiments, the gate structure 404 may comprise a polysilicon gate electrode separated from the substrate 102 by way of a dielectric material (e.g., silicon dioxide, silicon nitride, or the like). In some embodiments, sidewall spacers 408 may be disposed along opposing sides of the gate structure 404. In some embodiments, isolation structures 410 may be disposed within the substrate 102 on opposing sides of the transistor device 402. In some embodiments, the isolation structures 410 may comprise shallow trench isolation (STI) structures.

The dielectric structure 104 comprises a plurality of inter-level dielectric (ILD) layers 414 a-414 b stacked onto one another. In some embodiments, one or more of the plurality of ILD layers 414 a-414 b may comprise an ultra low-k (ULK) dielectric material or an extreme low-k (ELK) dielectric material. The ULK and ELK dielectric materials have a lower mechanical strength (e.g., are more porous) than low-k dielectric materials within the dielectric structure 104. In some embodiments, the dielectric structure 104 may be separated from the substrate 102 by way of a contact etch stop layer (CESL) 412. In some embodiments, the CESL 412 extends to over an upper surface of the gate structure 404. In some embodiments, the plurality of ILD layers 414 a-414 b may be separated from one another by etch stop layers 416 a-416 b.

A standard via 111 v _(s) and an oversized via 111 v _(o) are disposed within a first ILD layer 414 a. A first interconnect wire 109 w 1 and a second interconnect wire 109 w ₂ are disposed within a second ILD layer 414 b on the first ILD layer 414 a. The standard via 111 v _(s) contacts the first interconnect wire 109 w 1 and the oversized via 111 v _(o) contacts the second interconnect wire 109 w ₂. The oversized via 111 v _(o) has a larger size than the standard via 111 v _(s).

A TSV 112 extends through the substrate 102 and between the oversized via 111 v _(o) and a bond pad structure 114 disposed along a back-side of the substrate 102. In some embodiments, the TSV 112 may comprise a back-side through-substrate via (BTSV). In such embodiments, the TSV 112 may have tapered sidewalls so that the TSV 112 has a greater width along a second side (e.g., a back-side) of the substrate 102 than along the first side of the substrate 102. In some embodiments, the TSV 112 may have a top surface that has a width 418. In some embodiments, the width 418 may be between approximately 500 μm and approximately 900 μm, between approximately 600 μm and approximately 800 μm, approximately equal to approximately 700 μm, or other similar values.

The TSV 112 contacts the oversized via 111 v _(o) along an interface that is separated from the dielectric structure 104 by the oversized via 111 v _(o). It has been appreciated that when the TSV 112 contacts the oversized via 111 v _(o) along an interface comprising a ULK or ELK material, that an etchant used to form the TSV 112 may laterally over-etch the ULK or ELK material, leading to reliability concerns (e.g., TDDB). However, by separating the TSV 112 from the dielectric structure 104, damage (e.g., lateral over-etching) to ULK and/or ELK materials within the dielectric structure 104 can be mitigated and reliability of the integrated chip structure can be improved. In some embodiments, the TSV 112 may extend through one or more of the isolation structures 410. In such embodiments, when an etchant is used to etch through the substrate 102, the etchant will contact the oversized via 111 v _(o) at a position that is laterally surrounded by the isolation structure 410.

As shown in top-view 420 of FIG. 4B, the oversized via 111 v _(o) and the second interconnect wire 109 w ₂ laterally extend past opposing sidewalls of the TSV 112. In some embodiments, the second interconnect wire 109 w ₂ may also laterally extend past opposing sidewalls of the oversized via 111 v _(o). In some embodiments, the oversized via 111 v _(o) continuously extends without openings between outermost sidewalls of the oversized via 111 v _(o) along a first direction and along a second direction that is perpendicular to the first direction.

In some embodiments, the oversized via 111 v _(o) may have a length 422 and a width 424 in a range of between approximately 0.5 μm and approximately 2 μm, between approximately 0.8 μm and approximately 1.0 μm, or other similar values. In some embodiments, the oversized via 111 v _(o) may extend past an edge of the TSV 112 for a distance 426 that is in a range of between approximately 0 μm and approximately 100 μm, between approximately 60 μm and approximately 90 μm, or similar values.

In some embodiments, the length 422 and the width 424 of the oversized via 111 v _(o) may be between approximately 400% and approximately 5,000% larger than a length 428 and a width 430 of the standard via 111 v _(s). In other embodiments, the length 422 and the width 424 of the oversized via 111 v _(o) may be between approximately 2,000% and approximately 5,000% larger than the length 428 and the width 430 of the standard via 111 v _(s). In some embodiments, the length 428 and the width 430 of the standard via 111 v _(s) may be in a range of between approximately 0.01 micron (μm) and approximately 0.5 μm, between approximately 0.01 μm and approximately 0.05 μm, or other similar values.

The relatively large size of the oversized via 111 v _(o) provides improved electrical and design characteristics compared to the standard via 111 v _(s) or an array of standard vias. For example, the oversized via 111 v _(o) is able carry a same current as an array of standard vias while consuming a smaller area (e.g., an array of 16 standard vias having a collective length and width of approximately 3.22 μm may be able to collectively carry a current of approximately 48 mA, while an oversized via 111 v _(o) having a length and width of approximately 1.6 μm may be able to carry a current of approximately 48 mA at a same current density). In some embodiments, the oversized via 111 v _(o) can carry a same current as an array of standard vias, while consuming an area that is approximately equal to 25% of the array. Alternatively, the oversized via 111 v _(o) may carry a larger current than an array of standard vias having a same area (e.g., an array of 16 standard vias having a collective length and width of approximately 3.22 μm may be able to collectively carry a current of approximately 48 mA, while an oversized via 111 v _(o) having a length and width of approximately 3.22 μm may be able to carry a current of 190 mA at a same current density). In some embodiments, the oversized via 111 v _(o) may carry a current that is over 4 times larger than that of an array of standard vias at a same current density.

FIG. 5 illustrates a cross-sectional view of some additional embodiments of an integrated chip structure 500 having an oversized via configured to act as a stop layer for a TSV.

The integrated chip structure 500 comprises a transistor device 502 disposed along a front-side of the substrate 102. The transistor device 502 comprises a gate structure 504 disposed between a source region 406 a and a drain region 406 b. The gate structure 504 may comprise a metal gate electrode that is separated from the substrate 102 by a high-κ dielectric material. In some embodiments, the metal gate electrode may comprise aluminum, tungsten, or the like. In some embodiments, the high-κ dielectric material may comprise hafnium oxide, aluminum oxide, or the like. In some embodiments, sidewall spacers 506 may be disposed along opposing sides of the gate structure 504.

A contact etch stop layer (CESL) 508 is disposed over the substrate 102 and along sidewalls of the gate structure 504. The CESL 508 does not extend over a top of the gate structure 504. The gate structure 504 is laterally surrounded by a first ILD layer 414 a. A first etch stop layer 416 a is disposed on the first ILD layer 414 a and a second ILD layer 414 b is disposed on the first etch stop layer 416 a. A third ILD layer 414 c is separated from the second ILD layer 414 b by way of a second etch stop layer 416 b. A standard via 111 v _(s) and an oversized via 111 v _(o) are disposed within the third ILD layer 414 c. The standard via 111 v _(s) has a smaller size than the oversized via 111 v _(o). In some embodiments, the oversized via 111 v _(o) may have a thickness 514 that is in a range of between approximately 400 Angstroms (Å) and approximately 700 Å, between approximately 500 Å and approximately 600 Å, approximately 550 Å, or other similar values. In some embodiments, one or more middle-end-of-the-line (MEOL) interconnects 510-512 are disposed vertically between the oversized via 111 v _(o) and the substrate 102.

A first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂ are also disposed within the third ILD layer 414 c. The first interconnect wire 109 w ₁ contacts the standard via 111 v _(s) and the second interconnect wire 109 w ₂ contacts the oversized via 111 v _(o). In some embodiments, the second interconnect wire 109 w ₂ may have a thickness 516 that is in a range of between approximately 500 Å and approximately 800 Å, between approximately 600 Å and approximately 700 Å, approximately 650 Å, or other similar values.

A TSV 112 extends through the substrate 102, the CESL 508, the first ILD layer 414 a, the first etch stop layer 416 a, and the second ILD layer 414 b. Because the TSV 112 extends through the first ILD layer 414 a and the second ILD layer 414 b, the TSV 112 extends vertically past the one or more MEOL interconnects 510-512. In some embodiments, the oversized via 111 v _(o) and the second interconnect wire 109 w ₂ may collectively have a thickness that is greater than or equal to approximately 1,000 Å, approximately 1,200 Å, approximately 1,500 Å, or similar values. Such collective thicknesses provide for sufficient resistance to over-etching to prevent an etchant used to form the TSV 112 from etching through the oversized via 111 vo and the second interconnect wire 109 w ₂.

In various embodiments, the second ILD layer 414 b may have a first mechanical strength and the third ILD layer 414 c may have a second mechanical strength that is less than the first mechanical strength (e.g., the third ILD layer 414 c may be more porous than the second ILD layer 414 b). For example, in some embodiments, the second ILD layer 414 b may comprise a low-k dielectric material (e.g., a dielectric having a dielectric constant around 3.0, such as undoped silicate glass (USG), fluorosilicate glass, organosilicate glass, or the like) and the third ILD layer 414 c may comprise a ULK material or an ELK material (e.g., a dielectric having a dielectric constant of around 2.5 or less, such as SiCOH, pSiCOH, or the like).

The TSV 112 contacts the oversized via 111 v _(o) along an interface that is separated from the third ILD layer 414 c. Because the TSV 112 contacts the oversized via 111 v _(o) along an interface that is separated from the third ILD layer 414 c, the oversized via 111 v _(o) prevents an etchant used to form the TSV 112 from contacting the third ILD layer 414 c. Rather, the etchant used to form the TSV 112 contacts the second ILD layer 414 b, which has a greater mechanical strength than the third ILD layer 414 c. The greater mechanical strength provides for a greater resistance to over-etching along a lateral direction. By mitigating over-etching along a lateral direction, damage to the dielectric structure 104 is mitigated and reliability is improved.

FIG. 6 illustrates a cross-sectional view of some additional embodiments of an integrated chip structure 600 having an oversized via configured to act as a stop layer for a TSV.

The integrated chip structure 600 comprises a first IC tier 202 a and a second IC tier 202 b. The first IC tier 202 a comprises a first dielectric structure 104 a disposed on a first substrate 102 a and surrounding a first plurality of interconnect layers 106 a. The second IC tier 202 b comprises a second dielectric structure 104 b disposed on a second substrate 102 b and surrounding a second plurality of interconnect layers 106 b. In some embodiments, a sensor element not shown) may be disposed within the second substrate 102 b. The sensor element is configured to generate an electrical signal in response to incident radiation (e.g., light). In some embodiments, the sensor element includes a photodetector, such as a photodiode.

The first IC tier 202 a is bonded to the second IC tier 202 b in a face-to-back bonding configuration. In the face-to-back bonding configuration, the first substrate 102 a is vertically between the first dielectric structure 104 a and the second dielectric structure 104 b. In some embodiments, the first IC tier 202 a is bonded to the second IC tier 202 b by way of a bonding structure 601 disposed between a back-side of the first substrate 102 a and the second dielectric structure 104 b. In some embodiments, the bonding structure 601 comprises a first dielectric bonding layer 604 a disposed along the back-side of the first substrate 102 a and a second dielectric bonding layer 604 b disposed along the second dielectric structure 104 b. A plurality of conductive routing layers 602 a-602 b (e.g., RDL layers) and one or more conductive dummy bonding structures 606 are disposed within the first dielectric bonding layer 604 a. The first dielectric bonding layer 604 a is bonded to the second dielectric bonding layer 604 b, the plurality of conductive routing layers 602 a-602 b are coupled to a top interconnect layer 108 t, and the plurality of conductive dummy bonding structures 606 are bonded to dummy interconnects 108 d along a hybrid bonding interface.

A first TSV 112 a extends through the first substrate 102 a to couple the first plurality of interconnect layers 106 a to the second plurality of interconnect layers 106 b. The first TSV 112 a contacts a first oversized via 111 v _(o1) disposed within the first dielectric structure 104 a on the first substrate 102 a. In some embodiments, the first TSV 112 a may extend through the first oversized via 111 v _(o1) to further contact a first interconnect wire 109 w ₁ within the first dielectric structure 104 a.

A second TSV 112 b extends through the second substrate 102 b to couple the second plurality of interconnect layers 106 b to a bond pad structure 114 disposed along a back-side of the second substrate 102 b. The second TSV 112 b contacts a second interconnect wire 109 w ₂ disposed within the second dielectric structure 104 b on the second substrate 102 b. In some embodiments, the second TSV 112 b may extend through the second interconnect wire 109 w ₂ to further contact a second oversized via 111 v _(o2) within the second dielectric structure 104 b.

FIG. 7 illustrates a cross-sectional view of some additional embodiments of an integrated chip structure 700 having an oversized via configured to act as a stop layer for a TSV.

The integrated chip structure 700 comprises a first IC tier 202 a bonded to a second IC tier 202 b in a face-to-back bonding configuration. A first TSV 112 a extends through a first substrate 102 a to couple a first plurality of interconnect layers 106 a within a first dielectric structure 104 a to a second plurality of interconnect layers 106 b within a second dielectric structure 104 b. The first TSV 112 a contacts a first interconnect wire 109 w ₁ physically contacting a first oversized via 111 v _(o1) within the first dielectric structure 104 a.

A second TSV 112 b extends through the second substrate 102 b to couple the second plurality of interconnect layers 106 b to a bond pad structure 114 disposed along a back-side of the second substrate 102 b. The second TSV 112 b contacts a second interconnect wire 109 w ₂ physically contacting a second oversized via 111 v _(o2) disposed within the second dielectric structure 104 b.

FIG. 8 illustrates a cross-sectional view of some additional embodiments of an integrated chip structure 800 having an oversized via configured to act as a stop layer for a TSV.

The integrated chip structure 800 comprises a dielectric structure 104 disposed along a first side 103 a of a substrate 102 and surrounding an interconnect wire layer 108 and a via layer 110. The interconnect wire layer 108 comprises a first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂. The via layer 110 comprises a standard via 111 v _(s) contacting the first interconnect wire 109 w ₁ and an oversized via 111 v _(o) contacting the second interconnect wire 109 w ₂.

A TSV 112 that extends through a substrate 102 between the oversized via 111 v _(o) and a bond pad structure 114 along a second side 103 b of the substrate 102 opposing the first side 103 a of the substrate 102. In some embodiments, the TSV 112 has a first end 112 e ₁ that is proximate to the first side 103 a of the substrate 102 and a second end 112 e ₂ that is proximate to the second side 103 b of the substrate 102. The first end 112 e ₁ of the TSV 112 has a first width and the second end 112 e ₂ of the TSV 112 has a second width that is larger than the first width. In some embodiments, the first end 112 e ₁ of the TSV 112 has a rounded surface that contacts the oversized via 111 v _(o) and/or the second interconnect wire 109 w ₂. In some embodiments, the TSV 112 may extend through the oversized via 111 v _(o) to within the second interconnect wire 109 w ₂.

In some embodiments, the TSV 112 is laterally separated from the substrate 102 by a liner 802. In some embodiments, the liner 802 may comprise a dielectric material such as an oxide (e.g., silicon dioxide), a nitride (e.g., silicon nitride), or the like.

FIG. 9 illustrates a cross-sectional view of some additional embodiments of an integrated chip structure 900 having an oversized via configured to act as a stop layer for a TSV.

The integrated chip structure 900 comprises a dielectric structure 104 disposed along a first side of a substrate 102. The dielectric structure 104 has a plurality of ILD layers 414 a-414 c separated by etch stop layers 416 a-416 b. In some embodiments, a standard via 111 v _(s), an oversized via 111 v _(o), a first interconnect wire 109 w ₁, and a second interconnect wire 109 w ₂ may be surrounded by a third ILD layer 414 c. In some embodiments, the oversized via 111 v _(o) may extend from within the third ILD layer 414 c, through a second etch stop layer 416 b, and to within a second ILD layer 414 b. In such embodiments, the oversized via 111 v _(o) may extend a non-zero distance 902 past a bottom of a standard via 111 v _(s) so that the oversized via 111 v _(o) has a surface that is disposed along a horizontal line that intersects an underlying interconnect 904 (e.g., a MEOL interconnect). In some such embodiments, a surface of the oversized via 111 v _(o) facing the substrate 102 does not contact an interconnect.

A TSV 112 extends through the substrate 102. In some embodiments, the TSV 112 may comprise a diffusion barrier layer 908 that separates a metal core 906 of the TSV 112 from a liner 802. In some embodiments, the metal core 906 may comprise copper, aluminum, or the like. In some embodiments, the diffusion barrier layer 908 may comprise tantalum nitride, titanium nitride, or the like.

In some embodiments, the liner 802 may extend outward from the substrate 102 and through one or more of the plurality of ILD layers 414 a-414 b and/or etch stop layers 416 a-416 b of the dielectric structure 104. For example, in some embodiments, the liner 802 may extend through a first ILD layer 414 a and a first etch stop layer 416 a to an end that is within a second ILD layer 414 b. In some embodiments, the liner 802 is separated from the oversized via 111 v _(o) by way of dielectric structure 104.

FIG. 10 illustrates a cross-sectional view of some additional embodiments of an integrated chip structure 1000 having an oversized via configured to act as a stop layer for a TSV.

The integrated chip structure 1000 comprises an oversized via 111 v _(o) laterally separated from a standard via 111 v _(s) by a dielectric structure 104 on a substrate 102. The standard via 111 v _(s) is vertically between a first interconnect wire 109 w ₁ and a first overlying interconnect wire 1002 w 1. The oversized via 111 v _(o) is vertically between a second interconnect wire 109 w ₂ and a second overlying interconnect wire 1002 w ₂. In some embodiments, the first interconnect wire 109 w ₁ and the second interconnect wire 109 w ₂ are separated from the substrate 102 by one or more additional interconnect layers (e.g., one or more MEOL interconnect layers). The standard via 111 v _(s) and the oversized via 111 v _(o) have substantially similar heights. A TSV 112 vertically extends through the second interconnect wire 109 w ₂ and into the oversized via 111 v _(o) and/or the second overlying interconnect wire 1002 w ₂.

FIGS. 11-21 illustrate cross-sectional views 1100-2100 of some embodiments of a method of forming an integrated chip structure having an oversized via configured to act as a stop layer for a TSV. Although FIGS. 11-21 are described in relation to a method, it will be appreciated that the structures disclosed in FIGS. 11-21 are not limited to such a method, but instead may stand alone as structures independent of the method.

As shown in cross-sectional view 1100 of FIG. 11, a first integrated chip (IC) tier 202 a is formed. In some embodiments, the first IC tier 202 a may be formed by forming a first plurality of interconnect layers 106 a within a first dielectric structure 104 a formed over a first substrate 102 a. In some embodiments, the first dielectric structure 104 a may comprise a plurality of ILD layers stacked onto one another. In some embodiments, the first plurality of interconnect layers 106 a may comprise a conductive contact, an interconnect wire, and an interconnect via. In some embodiments, the first plurality of interconnect layers 106 a may be formed by damascene processes. In such embodiments, the first plurality of interconnect layers 106 a may be formed by forming one of the plurality of ILD layers, selectively etching the ILD layer to define a via hole and/or a trench within the ILD layer, forming a conductive material (e.g., copper, aluminum, etc.) within the via hole and/or a trench to fill the opening, and performing a planarization process (e.g., a chemical mechanical planarization process). In some embodiments (not shown), one or more transistor devices may be formed within the first substrate 102 a prior to the formation of the first dielectric structure 104 a.

As shown in cross-sectional view 1200 of FIG. 12, a first interconnect wire layer comprising a first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂ is formed within a first ILD layer 414 a on a second substrate 102 b. In some embodiments, the first ILD layer 414 a is separated from the second substrate 102 b by one or more ILD layers (not shown). In some embodiments, the first interconnect wire layer 108 a may be formed by way of a damascene process. In such embodiments, the first ILD layer 414 a is formed over the second substrate 102 b. The first ILD layer 414 a is selectively etched to form interconnect trenches, which are subsequently filled with a conductive material (e.g., tungsten, copper, and/or aluminum). A planarization process (e.g. CMP process) is subsequently performed to remove excess of the conductive material from over the first ILD layer 414 a to define the first interconnect wire 109 w 1 and the second interconnect wire 109 w ₂. In some embodiments (not shown), one or more transistor devices may be formed within the second substrate 102 b prior to the formation of the first ILD layer 414 a.

As shown in cross-sectional view 1300 and 1306 of FIGS. 13A and 13B, a via layer comprising a standard via 111 v _(s) and an oversized via 111 v _(o) is formed. The standard via 111 v _(s) is formed over the first interconnect wire 109 w ₁ and the oversized via 111 v _(o) is formed over the second interconnect wire 109 w ₂. In some embodiments, the standard via 111 v _(s) and the oversized via 111 v _(o) may be formed by way of a damascene process. In some such embodiments, a second ILD layer 414 b is formed onto the first ILD layer 414 a, as shown in cross-sectional view 1300 of FIG. 13A. The second ILD layer 414 b is subsequently patterned to define a standard via hole 1302 and an oversized via hole 1304. The oversized via hole 1304 has a greater width than the standard via hole 1302. In some embodiments, the standard via hole 1302 and the oversized via hole 1304 may be formed using a single photolithography process (e.g., using a single photomask). The standard via hole 1302 and the oversized via hole 1304 are then filled with a conductive material (e.g., tungsten, copper, aluminum, and/or the like).

In some embodiments, a chemical mechanical planarization (CMP) process is subsequently performed to remove excess of the conductive material from over the second ILD layer 414 b and to define the standard via 111 v _(s) and the oversized via 111 v _(o), as shown in cross-sectional view 1306 of FIG. 13B. In some embodiments, the CMP process may cause slightly more dishing on the oversized via 111 v _(o) than on the standard via 111 v _(s). However, it has been appreciated that the dishing of the oversized via 111 v _(o) is small so as to prevent shorting or significant leakage within interconnect wires directly overlying the oversized via 111 v _(o).

As shown in cross-sectional view 1400 of FIG. 14, one or more additional interconnect layers 1402 are formed onto the standard via 111 v _(s) and the oversized via 111 v _(o) to define a second plurality of interconnect layers 106 b within a second IC tier 202 b. In some embodiments, the one or more additional interconnect layers 1402 may have larger sizes (e.g., widths and/or heights) than the first interconnect wire layer and the via layer. In some embodiments, the one or more additional interconnect layers 1402 may be formed by way of a damascene processes.

As shown in cross-sectional view 1500 of FIG. 15, the first IC tier 202 a is bonded to the second IC tier 202 b by way of a bonding structure 204. In some embodiments the first IC tier 202 a may be bonded to the second IC tier 202 b by way of a hybrid bonding process. In such embodiments, a first bonding layer 204 a may be formed onto the first IC tier 202 a and a second bonding layer 204 b may be formed onto the second IC tier 202 b. The first bonding layer 204 a and the second bonding layer 204 b respectively comprise metal bonding regions 206 and dielectric bonding regions 208. The first bonding layer 204 a is brought into contact with the second bonding layer 204 b so that the metal bonding regions 206 and the dielectric bonding regions 208 of the first bonding layer 204 a and the second bonding layer 204 b are aligned. Temperatures of the first bonding layer 204 a and the second bonding layer 204 b are then increased to form the bonding structure 204. In alternative embodiments, a direct bonding process, a eutectic bonding process, or the like may be used to bond the first IC tier 202 a to the second IC tier 202 b.

As shown in cross-sectional view 1600 of FIG. 16, the second substrate 102 b is thinned to reduce a thickness of the second substrate 102 b from a first thickness t₁ to a second thickness t₂. In various embodiments, the second substrate 102 b may be thinned by etching and/or mechanical grinding a back-side of the second substrate 102 b along line 1602. In some embodiments, the second substrate 102 b may be thinned by a first grinding process, a subsequent second grinding process, and a chemical mechanical polishing (CMP) process.

As shown in cross-sectional view 1700 and 1708 of FIGS. 17A-17B, a back-side of the second substrate 102 b is selectively etched to define a through-substrate via (TSV) opening 1714 extending through the second substrate 102 b to the second interconnect wire 109 w ₂. The TSV opening 1714 is defined by sidewalls of the second substrate 102 b. The TSV opening 1714 may also be defined by sidewalls of the second dielectric structure 104 b.

In some embodiments, the TSV opening 1714 may be formed using two separate etching processes. For example, as shown in cross-sectional view 1700 of FIG. 17A, a first etching process exposes a back-side of the second substrate 102 b to a second etchant 1704 according to a second masking layer 1706 to define an intermediate TSV opening 1702. The intermediate TSV opening 1702 extends through the second substrate 102 b to a surface of the second dielectric structure 104 b that is separated from the second interconnect wire 109 w ₂. A liner 802 is formed along interior surfaces of the intermediate TSV opening 1702. In various embodiments, the liner may be formed by way of a deposition process (e.g., CVD, PE-CVD, ALD, or the like). As shown in cross-sectional view 1708 of FIG. 17B, a second etching process exposes the liner 802 and the second dielectric structure 104 b to a third etchant 1710 according to a third masking layer 1712 to define the TSV opening 1714, which exposes the second interconnect wire 109 w ₂. In some embodiments, the second etchant 1704 and/or the third etchant 1710 may comprise a dry etchant having an etching chemistry comprising fluorine, chlorine, or the like. In some embodiments, the second masking layer 1706 and the third masking layer 1712 may comprise a photosensitive material (e.g., a photoresist), a hard mask, or the like.

As shown in cross-sectional view 1800 of FIG. 18, a TSV 112 is formed within the TSV opening 1714. In some embodiments, the TSV 112 may be formed by forming one or more conductive materials within the TSV opening 1714. In some embodiments, the liner 802 may separate the one or more conductive materials from the second substrate 102 b. In various embodiments, the one or more conductive materials may be formed by way of a deposition process (e.g., CVD, PE-CVD, ALD, or the like), a plating process (e.g., electroplating, electro-less plating, etc.), or the like. In various embodiments, the one or more conductive materials may comprise tungsten, copper, aluminum, or the like. In some embodiments, a planarization process (e.g., a CMP process) may be performed after forming the one or more conductive materials within the TSV opening 1714 to remove excess of the one or more conductive materials from along the back-side of the second substrate 102 b.

As shown in cross-sectional view 1900 of FIG. 19, a bond pad structure 114 is formed onto the TSV 112. In some embodiments, the bond pad structure 114 may comprise one or more redistribution layers (RDL) formed onto the TSV 112. In some embodiments, one or more lower passivation layers 214-216 may be formed onto the back-side of the second substrate 102 b prior to formation of the bond pad structure 114. In some embodiments, the one or more lower passivation layers 214-216 may be formed by way of deposition processes (e.g., CVD, PE-CVD, ALD, or the like). In such embodiments, the one or more lower passivation layers 214-216 may be patterned to define a first opening 1902 exposing the TSV 112. A conductive material is subsequently formed within the first opening 1902 and over the one or more lower passivation layers 214-216. The conductive material may be subsequently patterned to define the bond pad structure 114. In some embodiments, the conductive material may comprise aluminum, tungsten, or the like. In various embodiments, the one or more conductive materials may be formed by way of a deposition process, a plating process, or the like.

As shown in cross-sectional view 2000 of FIG. 20, one or more upper passivation layers 218-220 are formed over the bond pad structure 114. The one or more upper passivation layers 218-220 may comprise a first upper passivation layer 218 and a second upper passivation layer 220. In some embodiments, the one or more upper passivation layers 218-220 may be formed by way of a deposition process (e.g., CVD, PE-CVD, ALD, or the like).

The one or more upper passivation layers 218-220 are selectively patterned to form a second opening 2002 extending through the one or more upper passivation layers 218-220. In some embodiments, the second opening 2002 exposes an upper surface of the bond pad structure 114. In some embodiments, the one or more upper passivation layers 218-220 may be selectively patterned by exposing the one or more upper passivation layers 218-220 to a fourth etchant 2004 according to a fourth masking layer 2006. In some embodiments, the fourth etchant 2004 may comprise a dry etchant having an etching chemistry comprising fluorine, chlorine, or the like. In some embodiments, the fourth masking layer 2006 may comprise a photosensitive material (e.g., a photoresist), a hard mask, or the like.

As shown in cross-sectional view 2100 of FIG. 21, a conductive bonding structure 118 is formed within the second opening 2002 defined by the one or more upper passivation layers 218-220. In some embodiments, the conductive bonding structure 118 may comprise a UBM 118 a formed onto the bond pad structure 114 and a conductive bump 118 b (e.g., a solder bump) formed onto the UBM 118 a.

FIG. 22 illustrates a flow diagram of some embodiments of a method 2200 of forming an integrated chip structure having an oversized via configured to act as a stop layer for a TSV.

While the methods (e.g., methods 2200 and 3400) disclosed herein is illustrated and described herein as a series of acts or events, it will be appreciated that the illustrated ordering of such acts or events are not to be interpreted in a limiting sense. For example, some acts may occur in different orders and/or concurrently with other acts or events apart from those illustrated and/or described herein. In addition, not all illustrated acts may be required to implement one or more aspects or embodiments of the description herein. Further, one or more of the acts depicted herein may be carried out in one or more separate acts and/or phases.

At 2202, a first integrated chip (IC) tier is formed to have first plurality of interconnect layers within a first dielectric structure on a first substrate. FIG. 11 illustrates a cross-sectional view 1100 of some embodiments corresponding to act 2202.

At 2204, a first interconnect wire layer comprising a first interconnect wire and a second interconnect wire is formed within a first ILD layer on a second substrate. FIG. 12 illustrates a cross-sectional view 1200 of some embodiments corresponding to act 2204.

At 2206, a standard via is formed within a second ILD layer and directly over the first interconnect wire. FIGS. 13A-13B illustrate cross-sectional views, 1300 and 1306, of some embodiments corresponding to act 2206.

At 2208, an oversized via is formed within the second ILD layer and directly over the second interconnect wire. FIGS. 13A-13B illustrate cross-sectional views, 1300 and 1306, of some embodiments corresponding to act 2208.

At 2210, one or more additional interconnect layers are formed within additional ILD layers over the standard via and the oversized via to define a second IC tier. FIG. 14 illustrates a cross-sectional view 1400 of some embodiments corresponding to act 2210.

At 2212, the first IC tier is bonded to the second IC tier by way of a bonding structure. FIG. 15 illustrates a cross-sectional view 1500 of some embodiments corresponding to act 2212.

At 2214, a thickness of the second substrate is reduced. FIG. 16 illustrates a cross-sectional view 1600 of some embodiments corresponding to act 2214.

At 2216, a backside of second substrate is selectively etched to define a TSV opening extending to the second interconnect wire. FIG. 17 illustrates a cross-sectional view 1700 of some embodiments corresponding to act 2216.

At 2218, a TSV is formed within the TSV opening. FIG. 18 illustrates a cross-sectional view 1800 of some embodiments corresponding to act 2218.

At 2220, a bond pad structure is formed onto the TSV. FIG. 19 illustrates a cross-sectional view 1900 of some embodiments corresponding to act 2220.

At 2222, one or more upper passivation layers are formed onto the bond pad structure. FIG. 20 illustrates a cross-sectional view 2000 of some embodiments corresponding to act 2222.

At 2224, a conductive bonding structure is formed onto the bond pad structure and within an opening extending through the one or more upper passivation layers. FIG. 21 illustrates a cross-sectional view 2100 of some embodiments corresponding to act 2224.

FIGS. 23-33 illustrate cross-sectional views 2300-3300 of some alternative embodiments of a method of forming an integrated chip structure having an oversized via configured to act as a stop layer for a TSV. Although FIGS. 23-33 are described in relation to a method, it will be appreciated that the structures disclosed in FIGS. 23-33 are not limited to such a method, but instead may stand alone as structures independent of the method.

As shown in cross-sectional view 2300 of FIG. 23, a first integrated chip (IC) tier 202 a is formed. The first IC tier 202 a comprises a first plurality of interconnect layers 106 a disposed within a first dielectric structure 104 a on a first substrate 102 a. In some embodiments, the first IC tier 202 a may be formed as described above in relation to cross-sectional view 1100 of FIG. 11.

As shown in cross-sectional views 2400 and 2402 of FIGS. 24A-24B, a via layer having a standard via 111 v _(s) and an oversized via 111 v _(o) is formed within a first ILD layer 414 a. In some embodiments, the standard via 111 v _(s) and the oversized via 111 v _(o) may be formed using a damascene process. For example, a first ILD layer 414 a may be formed onto the second substrate 102 b, as shown in cross-sectional view 2400 of FIG. 24A. The first ILD layer 414 a is subsequently patterned to define a standard via hole 1302 and an oversized via hole 1304. The oversized via hole 1304 has a greater width than the standard via hole 1302. As shown in cross-sectional view 2400 of FIG. 24B, a standard via 111 v _(s) is formed within the standard via hole 1302 and an oversized via 111 v _(o) is formed within the oversized via hole 1304.

As shown in cross-sectional view 2500 of FIG. 25, a first interconnect wire layer comprising a first interconnect wire 109 w ₁ and a second interconnect wire 109 w ₂ is formed over the first ILD layer 414 a. The first interconnect wire 109 w ₁ is formed on the standard via 111 v _(s) and the second interconnect wire 109 w ₂ is formed over the oversized via 111 v _(o). In some embodiments, the first interconnect wire 109 w ₁ and the second interconnect wire 109 w ₂ may be formed within a second ILD layer 414 b on the first ILD layer 414 a. In other embodiments (not shown), the first interconnect wire 109 w ₁ and the second interconnect wire 109 w ₂ may be formed within the first ILD layer 414 a.

As shown in cross-sectional view 2600 of FIG. 26, one or more additional interconnect layers 1402 are formed onto the first interconnect wire 109 w ₁ and the second interconnect wire 109 w ₂ to define a second IC tier 202 b. In some embodiments, the one or more additional interconnect layers 1402 may be formed as described above in relation to cross-sectional view 1400 of FIG. 14.

As shown in cross-sectional view 2700 of FIG. 27, the first IC tier 202 a is bonded to the second IC tier 202 b by way of a bonding structure 204. In various embodiments, the first IC tier 202 a may be bonded to the second IC tier 202 b as described above in relation to cross-sectional view 1500 of FIG. 15.

As shown in cross-sectional view 2800 of FIG. 28, a thickness of the second substrate 102 b is reduced. In various embodiments, the thickness of second substrate 102 b may be reduced as described above in relation to cross-sectional view 1600 of FIG. 16.

As shown in cross-sectional view 2900 of FIG. 29, a back-side of the second substrate 102 b is selectively etched to define a TSV opening 2902 extending through the second substrate 102 b to the oversized via 111 v _(o). In some embodiments, the TSV opening 2902 may be formed as described above in relation to cross-sectional views 1700 and 1708 of FIGS. 17A-17B.

As shown in cross-sectional view 3000 of FIG. 30, a TSV 112 is formed within the TSV opening 2902. In some embodiments, the TSV 112 may be formed as described above in relation to cross-sectional view 1800 of FIG. 18.

As shown in cross-sectional view 3100 of FIG. 31, a bond pad structure 114 is formed onto the TSV 112. In some embodiments, the bond pad structure 114 may be formed as described above in relation to cross-sectional view 1900 of FIG. 19.

As shown in cross-sectional view 3200 of FIG. 32, one or more upper passivation layers 218-220 are formed over the bond pad structure 114. In some embodiments, the one or more upper passivation layers 218-220 may be formed as described above in relation to cross-sectional view 2000 of FIG. 20.

As shown in cross-sectional view 3300 of FIG. 33, a conductive bonding structure 118 is formed within a second opening 2002 defined by the one or more upper passivation layers 218-220. In some embodiments, the conductive bonding structure 118 may comprise a UBM 118 a formed onto the bond pad structure 114 and a conductive bump 118 b (e.g., a solder bump) formed onto the UBM 118 a.

FIG. 34 illustrates a flow diagram of some alternative embodiments of a method 3400 of forming an integrated chip structure having an oversized via configured to act as a stop layer for a TSV.

At 3402, a first integrated chip (IC) tier is formed to have first plurality of interconnect layers within a first dielectric structure on a first substrate. FIG. 23 illustrates a cross-sectional view 2300 of some embodiments corresponding to act 3402.

At 3404, a standard via is formed within a first ILD layer formed on the second substrate. FIGS. 24A-24B illustrates cross-sectional views 2400-2402 of some embodiments corresponding to act 3404.

At 3406, an oversized via is formed within the first ILD layer. FIGS. 24A-24B illustrates cross-sectional views 2400-2402 of some embodiments corresponding to act 3406.

At 3408, a first interconnect wire layer is formed. The first interconnect wire layer comprises a first interconnect wire formed on the standard via and a second interconnect wire formed on the oversized via. FIG. 25B illustrates a cross-sectional view 2500 of some embodiments corresponding to act 3408.

At 3410, one or more additional interconnect layers are formed within additional ILD layers over the first interconnect wire layer to define a second IC tier. FIG. 26 illustrates a cross-sectional view 2600 of some embodiments corresponding to act 3410.

At 3412, the first IC tier is bonded to the second IC tier by way of bonding structure. FIG. 27 illustrates a cross-sectional view 2700 of some embodiments corresponding to act 3412.

At 3414, a thickness of the second substrate is reduced. FIG. 28 illustrates a cross-sectional view 2800 of some embodiments corresponding to act 3414.

At 3416, a back-side of second substrate is selectively etched to define a TSV opening extending to the oversized via. FIG. 29 illustrates a cross-sectional view 2900 of some embodiments corresponding to act 3416.

At 3418, a TSV is formed within the TSV opening. FIG. 30 illustrates a cross-sectional view 3000 of some embodiments corresponding to act 3418.

At 3420, a bond pad structure is formed onto the TSV. FIG. 31 illustrates a cross-sectional view 3100 of some embodiments corresponding to act 3420.

At 3422, one or more upper passivation layers are formed onto the bond pad structure. FIG. 32 illustrates a cross-sectional view 3200 of some embodiments corresponding to act 3422.

At 3424, a conductive bonding structure is formed onto the bond pad structure and within an opening in the one or more upper passivation layers. FIG. 33 illustrates a cross-sectional view 3300 of some embodiments corresponding to act 3424.

Accordingly, in some embodiments, the present disclosure relates to an integrated chip structure comprising an oversized via that is configured to act as a stop layer for a through-substrate via (TSV).

In some embodiments, the present disclosure relates to an integrated chip structure. The integrated chip structure includes a standard via disposed on a first side of a substrate; an oversized via disposed on the first side of the substrate and laterally separated from the standard via, the oversized via having a larger width than the standard via; an interconnect wire vertically contacting the oversized via; and a through-substrate via (TSV) extending from a second side of the substrate, and through the substrate, to physically contact the oversized via or the interconnect wire, the TSV having a minimum width that is smaller than a width of the oversized via. In some embodiments, the oversized via is vertically between the interconnect wire and the first side of the substrate. In some embodiments, the interconnect wire is vertically between the oversized via and the first side of the substrate. In some embodiments, the TSV extends vertically through the interconnect wire and into the oversized via. In some embodiments, the TSV extends vertically through the oversized via and into the interconnect wire. In some embodiments, the integrated chip structure further includes a gate structure disposed on the substrate; a first inter-level dielectric (ILD) layer laterally surrounding the gate structure; and a second ILD layer on the first ILD layer, the TSV extending through the first ILD layer to contact the oversized via at a position that is separated from the second ILD layer by the oversized via. In some embodiments, the interconnect wire and the oversized via collectively have a thickness that is greater than or equal to approximately 1,000 Angstroms. In some embodiments, the oversized via laterally extends past opposing sides of the TSV. In some embodiments, the oversized via has a first width that is between approximately 2,000% and approximately 5,000% larger than a second width of the standard via. In some embodiments, the TSV has a rounded surface that physically contacts the interconnect wire or the oversized via.

In other embodiments, the present disclosure relates to an integrated chip structure. The integrated chip structure includes a first integrated chip tier having a first plurality of interconnect layers disposed within a first dielectric structure on a first substrate; a second integrated chip tier having a second plurality of interconnect layers disposed within a second dielectric structure on a second substrate, the second plurality of interconnect layers including a standard via physically contacting a first interconnect wire, and an oversized via physically contacting a second interconnect wire, the oversized via having a larger size than the standard via; and a through-substrate via (TSV) extending through the second substrate and physically contacting the oversized via, the oversized via laterally surrounding opposing sides of the TSV. In some embodiments, the oversized via has a width that is larger than a width of a surface of the TSV that is facing the second interconnect wire. In some embodiments, the integrated chip structure further includes a gate structure disposed on the second substrate, the TSV vertically extending from between sidewalls of the second substrate to past a surface of the gate structure that faces away from the second substrate. In some embodiments, the integrated chip structure further includes one or more middle-end-of-the-line (MEOL) interconnects disposed on the second substrate, the TSV vertically extending from between sidewalls of the second substrate to past the one or more MEOL interconnects. In some embodiments, the integrated chip structure further includes a first inter-level dielectric (ILD) layer on the second substrate; a second ILD layer on the first ILD layer, the first ILD layer having a higher dielectric constant than the second ILD layer; and the TSV extending through the first ILD layer to contact the oversized via at a position that is separated from the second ILD layer by the oversized via. In some embodiments, the first ILD layer is an oxide or low-k dielectric material and the second ILD layer is an extreme low-k (ELK) dielectric material or an ultra low-k (ULK) dielectric material. In some embodiments, the integrated chip structure further includes a liner disposed along sidewalls of the TSV and vertically extending through a first ILD layer of the second dielectric structure, the liner is vertically separated from the oversized via by a non-zero distance.

In yet other embodiments, the present disclosure relates to a method of forming an integrated chip structure. The method includes forming an interconnect wire within a first inter-level dielectric (ILD) layer formed along a first side of a substrate; forming a standard via within a second ILD layer formed along the first side of the substrate; forming an oversized via within the second ILD layer, wherein the oversized via has a larger width than the standard via; etching the substrate to form a through-substrate via (TSV) opening extending through the substrate to the interconnect wire or the oversized via, wherein the interconnect wire contacts the oversized via; and forming one or more conductive materials within the TSV opening to define a through-substrate via (TSV). In some embodiments, the first ILD layer is between the second ILD layer and the substrate. In some embodiments, the second ILD layer is between the first ILD layer and the substrate.

The foregoing outlines features of several embodiments so that those skilled in the art may better understand the aspects of the present disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also realize that such equivalent constructions do not depart from the spirit and scope of the present disclosure, and that they may make various changes, substitutions, and alterations herein without departing from the spirit and scope of the present disclosure. 

What is claimed is:
 1. An integrated chip structure, comprising: a standard contact disposed within a dielectric structure on a substrate; an oversized contact disposed within the dielectric structure and laterally separated from the standard contact, wherein the oversized contact has a larger width than the standard contact; an interconnect wire vertically contacting the oversized contact; a through-substrate via (TSV) vertically extending through the substrate, wherein the TSV physically and vertically contacts the oversized contact or the interconnect wire; and wherein the TSV vertically overlaps the oversized contact or the interconnect wire over a non-zero distance.
 2. The integrated chip structure of claim 1, wherein the TSV is arranged directly between interior sidewalls of the interconnect wire or the oversized contact.
 3. The integrated chip structure of claim 1, wherein the TSV extends vertically through the interconnect wire and into the oversized contact or vertically through the oversized contact and into the interconnect wire.
 4. The integrated chip structure of claim 1, further comprising: a gate structure disposed on the substrate; a first inter-level dielectric (ILD) layer laterally surrounding the gate structure; and a second ILD layer on the first ILD layer, wherein the TSV extends through the first ILD layer to contact the oversized contact at a position that is separated from the second ILD layer by the oversized contact.
 5. The integrated chip structure of claim 1, further comprising: an inter-level dielectric (ILD) layer disposed on the substrate, wherein the TSV is laterally separated from the ILD layer by the oversized contact.
 6. The integrated chip structure of claim 1, wherein the oversized contact comprises a horizontally extending surface that faces the TSV and that laterally surrounds the TSV.
 7. The integrated chip structure of claim 1, wherein the TSV has a bottommost surface that physically contacts an upper surface of the oversized contact or an upper surface the interconnect wire.
 8. The integrated chip structure of claim 1, further comprising: a dielectric liner laterally separating the TSV from the substrate, wherein the TSV protrudes outward from directly between sidewalls of the dielectric liner.
 9. An integrated chip structure, comprising: a standard via disposed along a first side of a substrate; an oversized via disposed along the first side of the substrate and laterally separated from the standard via, wherein the oversized via has a larger width than the standard via; a first interconnect wire vertically contacting the oversized via; a second interconnect wire vertically contacting the standard via and laterally separated from the first interconnect wire, the first interconnect wire and the second interconnect wire being a same vertical distance from the first side of the substrate; and a through-substrate via (TSV) extending through the substrate, wherein the TSV physically contacts the oversized via or the first interconnect wire.
 10. The integrated chip structure of claim 9, wherein an imaginary horizontal line, which is parallel to the first side of the substrate, extends through sidewalls of the standard via and the oversized via.
 11. The integrated chip structure of claim 9, wherein an imaginary horizontal line, which is parallel to the first side of the substrate, extends through sidewalls of the TSV and either the oversized via or the first interconnect wire.
 12. The integrated chip structure of claim 9, wherein a bottommost surface of the TSV physically contacts the oversized via or the first interconnect wire; and wherein a top of the oversized via and a bottom of the oversized via both have larger widths than the bottommost surface of the TSV.
 13. The integrated chip structure of claim 9, further comprising: an etch stop layer disposed on the substrate and along sidewalls of a gate structure, wherein the oversized via contacts the etch stop layer.
 14. The integrated chip structure of claim 9, further comprising: an ILD layer disposed on the substrate and laterally surrounding the standard via, wherein the oversized via completely separates the TSV from the ILD layer.
 15. A method of forming an integrated chip structure, comprising: forming an interconnect wire within a first inter-level dielectric (ILD) layer formed along a first side of a substrate; forming a second ILD layer along the first side of the substrate; etching the second ILD layer to form a standard via hole and an oversized via hole, the oversized via hole being wider than the standard via hole; forming a conductive material within the standard via hole and the oversized via hole to form a standard via within the standard via hole and an oversized via within the oversized via hole; etching the substrate and the interconnect wire or the oversized via to form a through-substrate via (TSV) opening extending through the substrate and into the interconnect wire or the oversized via; and forming one or more conductive materials within the TSV opening to define a through-substrate via (TSV).
 16. The method of claim 15, wherein the second ILD layer is between the first ILD layer and the substrate.
 17. The method of claim 15, wherein the first ILD layer is between the second ILD layer and the substrate.
 18. The method of claim 15, further comprising: performing a planarization process to remove excess of the conductive material from over the second ILD layer and to form the standard via and the oversized via.
 19. The method of claim 15, wherein the standard via hole and the oversized via hole are formed using a single photolithography process.
 20. The method of claim 15, wherein the substrate is etched by an etching process that etches completely through the oversized via. 